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Nikon L100

The ultimate CMM scanner combining productivity and accuracy.

The L100 CMM laser scanner offers the best possible combination of speed, accuracy and ease-of-use. Suited for both surface and feature measurement, the L100 quickly delivers accurate data and insightful part-to-CAD comparison reports, even on shiny or multi-material surfaces.

The L100 is ideal to inspect larger components where productivity is key, but without having to compromise on accuracy. Equipped with a high quality glass Nikon lens and a high definition camera, the L100 features a point resolution of 42 µm and an exceptionally small probing error of 6.5 μm, enabling delivery of smooth meshes and high levels of detail.

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Nikon L100

Ultrafast data collection

The L100 is ideal to inspect larger components where productivity is key but without having to compromise on accuracy. The 100 mm wide Field-of-View combined with the increased measurement speed results in measurement productivity that wasn’t achievable with CMM scanning before.

Capture the finest details

The L100 is equipped with a high quality glass Nikon lens optimized for laser scanning. Combined with the high definition camera this results in a point resolution of 42 μm and a data quality that is the best on the market, enabling fine detail capture and measurement of sharper edges. The L100 has an exceptionally small probing error of 6.5 μm, which is a measure of the scanner’s noise level, enabling delivery of smooth meshes and high levels of detail.

Accurate feature inspection

The L100 is perfectly suited for combined surface and feature measurements. Thanks to the low measurement noise and high point resolution, feature measurement accuracy approaches the accuracy of a touch probe.

Key Benefits

  • Ultrafast data collection – 200,000 points/s scan speed
  • Captures the finest details – Best-in-class probing error of 6.5 μm
  • Copes with changes in surface color – Enhanced scanning performance
  • Easy to use – Field-of-View (FOV) projection
  • Extends the measurement reach – Integrated mount rotation

Technical Specifications

All accuracy specifications valid for a CMM with an accuracy of 2µm + L/350 or better using manufacturer supplied test sphere.
1Nikon Metrology test comparable to EN/ISO 10360-2 MPEP using 1ơ sphere fit.
2Nikon Metrology test comparable to EN/ISO 10360-2 MPEE
3Nikon Metrology test comparable to EN/ISO 10360-5 MPEAL

Accuracy specifications according ISO 10360-8:2013:
4PForm.Sph.1×25:Tr:ODS,MPE : Maximum probing form error using 25 representative points in translatory scanning mode
5PSize.Sph.All:Tr:ODS,MPE : Maximum probing size error All using all measured points in translatory scanning mode
6PForm.Sph.D95%:Tr:ODS,MPL : Maximum probing dispersion value using 95% of the measured points in translatory scanning mode
7Cone angle : Region of sphere on which the measured points are selected

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