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Nikon XC65DX-LS

The ultimate scanner for feature inspection and more.

The multi-laser XC65Dx laser scanner captures all 3D details of features, edges, pockets, ribs and freeform surfaces in a single scan.

It’s entirely digital 3D digitizing operation boosts scanning frequency and drives smart laser intensity adaptation to scan any surface without user interaction.

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Nikon XC65DX-LS

3D capture of complex surfaces and features

Offering patented multi-laser capability, the XC65Dx(-LS) Cross Scanner captures all 3D details of features, edges, pockets, ribs and freeform surfaces in a single scan. Its cross pattern of 3 laser stripes allows it to acquire the full 3D view when scanning parts with more complex surface shapes and/or geometric features.

High scanning productivity

The XC65Dx Cross Scanner sets new productivity standards by introducing wider laser stripes and high-speed CMOS camera technology. Acquiring data at a faster pace makes it possible to drastically increase the velocity of the XC65Dx scanner during inspection. This boosts the number of features that can be scanned in the same time frame, or reduces the inspection cycle time for freeform parts.

XC65Dx(-LS) longer stand-off scanner variant

The XC65Dx-LS scanner variant with a longer stand-off distance offers distinct advantages. By capturing geometry up to a distance of 170mm (7.1”), the scanner gains optimum access to cavity surfaces of body-in-white structures or scan over the clamps that hold components in position. For these reasons, the XC65Dx-LS scanner is used a lot on horizontal-arm CMMs used in the automotive industry.

Key Benefits

  • Full 3D capture of complex surfaces and features geometry in a single scan
  • Fast and High accuracy feature measurements
  • Easy measurement preparation
  • Suited for both surface and feature scanning
  • Seamless retrofit with most leading CMM brands

Technical Specifications

All accuracy specifications valid for a CMM with an accuracy of 2µm + L/350 or better using manufacturer supplied test sphere
1Nikon Metrology test comparable to EN/ISO 10360-2 MPEP using 1 sigma sphere fit.
2Nikon Metrology test comparable to EN/ISO 10360-2 MPEE
3Nikon Metrology test comparable to EN/ISO 10360-5 MPEAL

Accuracy specifications according ISO 10360-8:2013:
4PForm.Sph.1×25:Tr:ODS,MPE : Maximum probing form error using 25 representative points in translatory scanning mode
5PSize.Sph.All:Tr:ODS,MPE : Maximum probing size error All using all measured points in translatory scanning mode
6PForm.Sph.D95%:Tr:ODS,MPL : Maximum probing dispersion value using 95% of the measured points in translatory scanning mode
7Cone angle : Region of sphere on which the measured points are selected

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